University of Regensburg, Regensburg, Germany, EU
Present position: Full Professor at Universität Regensburg, Faculty of Natural Sciences II - Physics, Institut for Experimental and Applied Physics, Germany (EU).
Specialization: Atomic force microscopy
At the NANOCON 2015 conference Prof. Giessibl will deliver the invited lecture at the session E - Advanced Methods of Preparation and Characterization of Nanomaterials.
Educationand Professional Track:
Prof. F. J. Giessibl (born 1962 in Amerang, Bavaria, Germany, EU) studied physics from 1982 to 1987 at the Technical University of Munich and at Eidgenössische Technischen Hochschule Zürich. He received a diploma in experimental physics in 1988 with Prof. Gerhard Abstreiter (diploma thesis in experimental semiconductor physics) and continued with a Ph.D. in physics with Nobel Laureate Gerd Binning at the IBM Physics Group Munich on atomic force microscopy. After working as a management consultant with McKinsey& Companyfrom 1995 to 1996, he joined Prof. Jochen Manhart at University of Augsburg, where he received a habilitation in 2001 (Habilitation-thesis "Progress in Atomic Force Microscopy"). In 2006, Prof. Giessibl joined the faculty at the Department of Physics at the University of Regensburg in Germany (EU).
Prof. F. J. Giessibl is a pioneer of atomic force microscopy, who published papers on experimental and theoretical aspects of atomic force microscopy. He is the inventor of the qPlus sensor, a sensor for Non-contact atomic force microscopy that relies on a quartz cantilever, originally based on quartz tuning forks.
Reaching the physical resolution limit of STM and AFM
Improve understanding of tip-sample interaction
Simplifying STM and AFM operation for
Image, Identify, Manipulate any atomic species on any surface (crystal & amorphous) in all environments (vacuum, gas, liquid).
Awards and Honors
Research ID of Prof. Giessibl: http://www.uni-regensburg.de/physics/giessibl/index.html