WORKSHOP

Datum: 15.10.2015

14:00 - 15:00

W1

NOWAK Andreas

Leica Mikrosysteme Vertrieb GmbH – DSA, Wien, Austria, EU

High-quality Surface Preparation of Material Samples using a Combination of Mechanical and Ion Beam Milling Methods - KOMERČNÍ PREZENTACE

Datum: 15.10.2015

15:00 - 16:00

W2

NOVOTNÝ Dušan

Measurement Technic Moravia Ltd., Zastavka, Czech Republic, EU

BioScope Resolve - Highest Resolution Bio-AFM - KOMERČNÍ PREZENTACE

16:00 - 17:00

W3

HOLÁŇ Jakub

Measurement Technic Moravia Ltd., Zastavka, Czech Republic, EU

AFM and Electrochemistry - KOMERČNÍ PREZENTACE