Prof. Dr. Franz Josef GIESSIBL

Prof. Dr. Franz Josef GIESSIBL

University of Regensburg, Regensburg, Germany, EU

Present position:  Full Professor at Universität Regensburg, Faculty of Natural Sciences II - Physics, Institut for Experimental and Applied Physics, Germany (EU).

Specialization: Atomic force microscopy


At the NANOCON 2015 conference Prof. Giessibl will deliver the invited lecture at the session E - Advanced Methods of Preparation and Characterization of Nanomaterials.


Educationand Professional Track:  
Prof. F. J. Giessibl (born 1962 in Amerang, Bavaria, Germany, EU) studied physics from 1982 to 1987 at the Technical University of Munich and at Eidgenössische Technischen Hochschule Zürich. He received a diploma in experimental physics in 1988 with Prof. Gerhard Abstreiter (diploma thesis in experimental semiconductor physics) and continued with a Ph.D. in physics with Nobel Laureate Gerd Binning at the IBM Physics Group Munich on atomic force microscopy. After working as a management consultant with McKinsey& Companyfrom 1995 to 1996, he joined Prof. Jochen Manhart at University of Augsburg, where he received a habilitation in 2001 (Habilitation-thesis "Progress in Atomic Force Microscopy"). In 2006, Prof. Giessibl joined the faculty at the Department of Physics at the University of Regensburg in Germany (EU).


Research interests:
Prof. F. J. Giessibl is a pioneer of atomic force microscopy, who published papers on experimental and theoretical aspects of atomic force microscopy. He is the inventor of the qPlus sensor, a sensor for Non-contact atomic force microscopy that relies on a quartz cantilever, originally based on quartz tuning forks.


Current research:
Reaching the physical resolution limit of STM and AFM

Improve understanding of tip-sample interaction

Simplifying STM and AFM operation for

Image, Identify, Manipulate any atomic species on any surface (crystal & amorphous) in all environments (vacuum, gas, liquid).


Awards and Honors


Research ID of Prof. Giessibl: