Prof. Dr. Franz Josef GIESSIBL

University of Regensburg, Regensburg, Germany, EU

Present position: Full Professor at Universität Regensburg, Faculty of Natural Sciences II - Physics, Institut for Experimental and Applied Physics, Germany (EU).

Specialization: Atomic force microscopy

At the NANOCON 2015 conference Prof. Giessibl will deliver the invited lecture at the session E - Advanced Methods of Preparation and Characterization of Nanomaterials.

Educationand Professional Track:
Prof. F. J. Giessibl (born 1962 in Amerang, Bavaria, Germany, EU) studied physics from 1982 to 1987 at the Technical University of Munich and at Eidgenössische Technischen Hochschule Zürich. He received a diploma in experimental physics in 1988 with Prof. Gerhard Abstreiter (diploma thesis in experimental semiconductor physics) and continued with a Ph.D. in physics with Nobel Laureate Gerd Binning at the IBM Physics Group Munich on atomic force microscopy. After working as a management consultant with McKinsey& Companyfrom 1995 to 1996, he joined Prof. Jochen Manhart at University of Augsburg, where he received a habilitation in 2001 (Habilitation-thesis "Progress in Atomic Force Microscopy"). In 2006, Prof. Giessibl joined the faculty at the Department of Physics at the University of Regensburg in Germany (EU).

Research interests:
Prof. F. J. Giessibl is a pioneer of atomic force microscopy, who published papers on experimental and theoretical aspects of atomic force microscopy. He is the inventor of the qPlus sensor, a sensor for Non-contact atomic force microscopy that relies on a quartz cantilever, originally based on quartz tuning forks.

Current research:
Reaching the physical resolution limit of STM and AFM

sensors with optimized physical properties
low temperatures
tips with defined chemical composition and structure

Improve understanding of tip-sample interaction

Simplifying STM and AFM operation for

applications in difficult environment (UHV, low temperatures)
tool to study insulators

Image, Identify, Manipulate any atomic species on any surface (crystal & amorphous) in all environments (vacuum, gas, liquid).

Awards and Honors

1994: R&D 100 Award (together with Brian Trafas)
2000: Deutscher Nanowissenschaftspreis
2001: Rudolf-Kaiser-Preis
2009: Karl Heinz Beckurts-Preis
2010: Ehrenfest Kolloquium Leiden (Netherlands)
2013: Zernike Kolloquium Groningen (Netherlands)
2014: Joseph F. Keithley Award for Advances in Measurement Science of the American Physical Society

Research ID of Prof. Giessibl: http://www.uni-regensburg.de/physics/giessibl/index.html

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